EAG to present at CSSC6

Cyril Michellon, EAG to present at the 6th International Workshop on Crystalline Silicon Solar Cells, Oct 8-11 in France.

Poster Session:
Quality Assurance of Photovoltaic Materials by Direct Sampling High Resolution Glow-Discharge Mass Spectrometry Methods

Oral Presentation, Wednesday, Oct 10th at 4:50 PM - 5:05 PM:
Trace analysis of Silicon by High Resolution HR-GDMS

Please contact Cyril Michellon with any questions.