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About EAG

Lab Director

Mr. John G. Newman

Mr. John G. Newman
Director of Analytical Services, Minnesota

John G. Newman completed his BS degree in chemistry at Gustavus Adolphus College in 1980 and his MS degree in analytical chemistry at the University of Minnesota in 1984. His graduate work under John F. Evans involved the plasma etching and thin film surface analysis of polymer coated electrodes.

John joined the Analytical Lab at Physical Electronics in 1983 where he specialized in Secondary Ion Mass Spectrometry (SIMS) and its application to both semiconductors (Dynamic SIMS) and organic materials (Static SIMS).

In 1990 John left Physical Electronics and became co-founder and Director of Analytical Services at Evans Central, a laboratory that specialized in materials characterization and problem solving using surface analysis instrumentation. In 1995 John returned to the Analytical Lab at Physical Electronics (later to become the Evans Analytical Group - MN Lab) where he was initially involved with the Quantum 2000 Scanning X-ray Photoelectron (XPS) system for contract analytical work. John is currently Director of Analytical Services where his duties involve staff management, technical marketing, and business planning.

Publications

  • "ASM Handbook, Vol 11, Failure Analysis and Prevention”- J.G. Newman, Chemical Characterization of Surfaces, Editors: Becker and Shipley, Published by ASM International, 2002, pp 527-537

  • "Analysis of Rampant Corrosion in Stainless Steel Retainers of Orthodontic Patients”- R.P. Kusy, W.W. Ambrose, L.A. LaVanier, J.G. Newman, J.Q. Whitley, J Biomed Mater Res, 2002 Oct, 62(1): 106-18

  • "Evaluation of Titanium Brackets for Orthodontic Treatment: Part I. The Passive Configuration”- R.P. Kusy, J.Q. Whitley, W.W. Ambrose, J.G. Newman, Amer J Orthod Dentofacial Orthop, 1998 Nov, 114(5): 558-72

  • "Static Secondary Ion Mass Spectrometry of Self-Assembled Alkanethiol Monolayers on Gold”- Michael J. Tarlov, John G. Newman, Langmuir, 1992, 8, 1398-1405

  • "Static SIMS Analysis of Rigid Magnetic Disk Contact Start/Stop Tracks”- J.G. Newman, W.W. Presson, SIMS VIII Conference Proceedings, Ed Benninghoven, Janssen, Tumpner, and Werner, John Wiley & Sons, New York, 1992, pp 761-4

  • "Static SIMS Handbook of Polymer Analysis”- John G. Newman, Brad A. Carlson, Raj. S. Michael, John F. Moulder, Editor Teresa A. Hohlt, Published by Perkin-Elmer Corp. Physical Electronics Division, 1991

  • "Gallium Beam SIMS Depth Profiling of Dielectrics for the Semiconductor Industry”- J. G. Newman, SIMS VII Conference Proceedings, Ed Benninghoven, Evans, McKeegan, Storms, and Werner, John Wiley & Sons, New York, 1990, pp 479-82

  • "Surface Characterization of Polycarbonate/Polybutylene Terephthalate Blends by Static Secondary Ion Mass Spectrometry”- R.S. Michael, W. Katz, J. Newman, and J. Moulder, SIMS VII Conference Proceedings, Ed Benninghoven, Evans, McKeegan, Storms, and Werner, John Wiley & Sons, New York, 1990, pp 773-5

  • "Purity and thickness analysis of fluoropolymers by static secondary ion mass spectrometry”- J.G. Newman and K.V. Viswanathan, J Vac Sci Technol, A 8(3), May/June 1990, 2388-92

  • "A Static SIMS Study of the Effects of Plasma Treatments on Polyethylene and Polypropylene”- W.J. van Ooij, R.H.G. Brinkhuis, and J. Newman, SIMS VI Conference Proceedings, Ed Benninghoven, Huber, and Werner, John Wiley & Sons, New York, 1988, pp 671-4

  • "The Effect of Sputtering Angle on Negative Atomic and Molecular Secondary Ion Yields using Cesium Bombardment”- J.G. Newman, SIMS VI Conference Proceedings, Ed Benninghoven, Huber, and Werner, John Wiley & Sons, New York, 1988, pp 63-6

  • "Fundamentals of Secondary Ion Mass Spectrometry”- W. Katz and J.G. Newman, Materials Research Society MRS Bulletin, Vol XII, Number 6, 1987 Aug 16/Sept 30

  • "Variable Angle SIMS”- J.G. Newman, SIMS V Conference Proceedings, Ed Benninghoven, Colton, Simons, and Werner, Springer-Verlag, New York, 1986, pp 313-315

  • "The Mechanism of Plasma Etching of Polymers and its Relevance to Adhesion”- John F. Evans, John G. Newman, and James H. Gibson, Proceedings of Symposium on Colloid and Surface Science in Computer Technology, K. Mittal, Ed. Plenum Press, 1986

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