Lab Director

Dr. Jim Vitarelli
Director of Analytical Services, North Carolina

Dr. Vitarelli has a broad understanding of general materials problems and analytical solutions.

In particular, he has strong expertise in the macro and microanalysis of microelectronic materials and devices and proficiency in the techniques of Transmission Electron Microscopy (TEM), Scanning Transmission Electron Microscopy (STEM), Focused Ion Beam (FIB) and Scanning Electron Microscopy and Energy Dispersive x-ray Spectroscopy (SEM/EDS).

After completing his Bachelor’s degree, Dr. Vitarelli joined Data General, where he had worked as a co-op student. He became responsible for the activities of the Data General failure analysis and reliability labs, overseeing all routine failure analysis, reliability testing and materials testing. He returned to school to complete his Ph.D. where his thesis work involved electron beam testing of multilevel metal integrated circuits and electronic devices. After completing his Ph.D. research, he accepted a position at Charles Evans and Associates (CE&A). His responsibilities at CE&A included designing appropriate analyses techniques, and the execution and interpretation of results for various clients using SEM/EDS. He joined Materials Analytical Services (MAS) in 1997 which was acquired in December 2006 by Evans Analytical Group® (EAG) where he is now the Director of Analytical Services for the EAG North Carolina laboratory. He directs a staff of scientists, and participates in analysis projects using SEM/EDS, FIB, TEM, STEM with EDS, and Optical Microscopy.

Dr. Vitarelli received both B.S. and Ph.D. degrees in Materials Science and Engineering from North Carolina State University. He has published several papers in the field and is named on a recent Patent for FIB gas assisted etching (GAE).