RTP Management

Raymond has vast experience with semiconductor design, debug and failure analysis. He brings distinctive and valuable insights to EAG’s comprehensive product engineering solutions.

Before helping start Nano Integrated Solutions in 2007, Raymond was founder and President of FIB International, Inc. an analytical lab for the testing, debug and failure analysis of microelectronic devices. Founded in 1996, it quickly became the leader of FIB technologies thanks to its highly experienced staff and state-of-the-art equipment. Raymond worked with numerous startup and established design houses on the latest generation of products while developing new protocols and methodologies to meet the challenges of the industry.

Earlier, Raymond worked for various semiconductor equipment companies like FEI and Schlumberger ATE doing marketing and application development. By working closely with equipment suppliers and customers, he was able to help develop new solutions for the increasingly complex semiconductor sectors.