Aerospace/Defense
The aerospace and defense industries both involve the use of highly specialized materials in demanding environments. This ranges from the construction materials used in airframes to the electronics used for high speed detection and communications. Across this wide range of applications, Evans Analytical Group® (EAG) has the experience and ability to contribute greatly to R&D and product development.
Materials of particular interest include: Ni-based superalloys; thermal barrier coatings; modern carbon composite materials; thermal and night vision sensor materials; radiation hardened electronics; high precision optics, glasses and plastics; solar panels; paints; ceramic armor materials and munitions all require tight control of material properties, composition and chemistry. EAG can monitor raw materials to keep the composition within a precise specification and can track impurities that can affect mechanical properties. EAG has the analytical tools and proven methodology to meet the most demanding analysis needs for defense and aerospace customers. Our colleagues in our Microelectronics Test and Engineering division offer and extensive array of testing for electronic parts, including counterfeit testing and MIL standard tests.
Application Examples
- Depth profiles for sulfur, phosphorus, and other embrittlement agents in thermal barrier coatings on aircraft engine blades
- Impurity characterization of magnesium-based alloys in aircraft body parts

- Characterization of contaminants in carbon composites in aircraft breaking systems
- Assessment of materials used in IR sensors for night vision and thermal sensing
- Failure analysis in high speed imaging applications
- Assessment of hazing on displays due to thermal outgassing
- Studies of delamination in coatings on aircraft
- Failure analysis of carbon fiber structural composites from aircraft
- Analysis of heat sensitive coatings
- Contamination on satellite parts
Related Application Notes
- FEI DualBeamTM FIB AN364
- Z-Contrast Imaging and Elemental Analysis of Ultra-thin Films utilizing Scanning Transmission Electron Microscopy (STEM) with Energy Dispersive X-ray Spectroscopy (EDS) AN461
- ICP-OES and ICP-MS Detection Limit Guidance BR023
- Characterization of Surface Contamination BN1365
- Evaluation of Cleaning Efficacy BN1422
- Grain Size Analysis of Metallurgical Coatings Using FIB BN1345
- Microtomy Advantages for Cross-sectioning Materials BN1399
- SIMS Characterization of HgCdTe Epilayer Structure AN442
- Identifying Contaminants Using Raman: Organic Particles AN376
- SIMS Detection Limits of Selected Elements in HgCdTe Under Normal Depth Profiling Conditions AN338




