Glow Discharge Mass Spectrometry, GDMS Analysis
Solid samples are analyzed using Glow Discharge Mass Spectrometry (GDMS) by exposing them to a gas discharge or plasma atomization / ionization source. Argon is typically used as the discharge gas. The sensitivity, ease of calibration, flexibility and the robustness to analyze a wide variety of sample types and matrices make GDMS an excellent choice for 
trace elemental analysis. Besides full elemental surveys, it is also possible to measure and quantitatively evaluate depth dependent elemental distributions with high sensitivity.
Evans Analytical Group® (EAG) is the industry leader for Glow Discharge Mass Spectrometry (GDMS) services, offering the best detection limits along with accurate mass fraction determinations in the broadest variety of solids, films and coatings. EAG's depth and breadth of experience and dedication to analytical method development in the GDMS field is unmatched, with the largest number of GDMS instruments and highly qualified scientists available to address your materials issues.
EAG regularly uses GDMS Analysis to help customers across a range of industries with R&D, quality control, and process monitoring and development. EAG's person-to-person service throughout the process, enables a full understanding of test results and their potential implications.
For Trace Elemental Analysis using GDMS, IGA, ICP-OES or LA-ICP-MS:
Evans Analytical Group (New York) - Sample Submittal Form (English, pdf)
Evans Analytical Group SAS (France) - Sample Submittal Form (English, pdf)
Evans Analytical Group SAS (France) - Sample Submittal Form (French, pdf)
- Full elemental survey analysis of high purity advanced inorganic solids (metals, alloys, graphites, semiconductors, oxides, ceramics).
- Depth dependent trace and ultra-trace distribution measurements on films and coatings.
- Identification of unknowns from small amounts of sample (<?g)
- Full element characterization of powders and particulates
Signal Detected: Ions
Elements Detected: Full periodic table (full survey of stable isotopes, except H)
Detection Limits: Sub-μg/kg (ppbw)
Typical Sampling Area: Between 5-15mm (50-80mm2)
- Full periodic table coverage (full survey of stable isotopes, except H)
- Sub-ppb (μg/kg) to ppt (ng/kg) detection
- Minimal matrix effects
- Linear and simple calibration
- Ability to analyze ceramics and other insulators
- Depth dependent distribution measurements with high sensitivity
- Sample heterogeneity
- Volatile samples
- Not suited for organic materials/polymers
- Sputter targets
- Aerospace
- Refractory metals and alloys
- Rare earth metals and metal oxides
- Electronic materials
- Photovoltaics and power generation materials
- High purity materials production
Related Application Notes
Related Brochures
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