Raman Spectroscopy, Raman Analysis
Raman Spectroscopy (Raman Analysis) enables you to determine the chemical structure of a sample and identify the compounds present by measuring molecular vibrations, similar to Fourier Transform Infrared Spectroscopy (FTIR). However, the method used with Raman yields better spatial resolution and enables the analysis of smaller samples.
Raman is a good technique for the qualitative analysis of organic and/or inorganic mixed materials and can also be employed for semi-quantitative and quantitative analysis. It is often used to:
- Identify organic molecules, polymers, biomolecules, and inorganic compounds both in the bulk and in individual particles
- Raman imaging and depth profiling is used to map the distribution of components in mixtures, such as drugs in excipients, tablets, and drug-eluting stent coatings
- Determine the presence of different carbon types (diamond, graphitic, amorphous carbon, diamond-like carbon, nanotubes, etc.) and their relative proportions, something for which it is particularly well suited
- Determine inorganic oxides and their valence state
- Measure the stress and crystalline structure in semiconductor and other materials

Evans Analytical Group® (EAG) offers our customers Raman services to analyze small contamination areas, identify materials in small areas, and measure stress. The resulting data helps our clients resolve problems quickly, reduce cycle times, and improve production processes. We believe that no competing lab can match the skill set and experience of our staff. Plus, you can count on fast turnaround times, accurate data, and person-to-person service, ensuring you understand the information that you receive.
- Identifying the molecular structure of organic and inorganic compounds for contamination analysis, material classification, and stress measurements
- Characterization of carbon layers (graphitic v. diamond)
- Non-covalent bonding (complexes, metal bonding)
- Orientation (random v. organized structure)
Signal Detected: Raman scattering
Elements Detected: Chemical and molecular bonding information
Detection Limits: >=1 wt%
Depth Resolution: Confocal mode 1 - 5 µm
Imaging/Mapping: Yes
Laterall Resolution/Probe Size: >=1 µm
- Capable of identifying organic functional groups and often specific organic compounds
- Spectral libraries for compound identification
- Ambient conditions (not vacuum; good for semi-volatile compounds)
- Typically non-destructive
- Minimum analysis area: ~1 µm
- Limited surface sensitivity (typical sampling volumes are ~0.8 µm)
- Minimum analysis area: ~1 µm
- Limited inorganic information
- Typically not quantitative (needs standards)
- Fluorescence (much more intense than the Raman signal) can limit Raman usefulness
- Aerospace
- Automotive
- Biomedical/biotechnology
- Compound Semiconductor
- Data Storage
- Defense
- Displays
- Electronics
- Industrial Products
- Lighting
- Pharmaceutical
- Photonics
- Polymer
- Semiconductor
- Solar Photovoltaics
- Telecommunications
Related Application Notes
- Identification of Foreign Material on Pharmaceutical Tablets
- Study of Carbon Nanotubes by Resonant Raman Spectroscopy AN446
- Evaluating Polymer Cure Using Raman Spectroscopy BN1394
- Diamond Like Carbon (DLC) Distribution on a Magnetic Head Surface AN352
- Identifying Contaminants Using Raman: Organic Particles AN376
- Raman Mapping of Strained Si/SiGe AN407
- Semiconductor Stress Measurements by Raman Spectroscopy AN395
- Characterization Methods for Copper Technology AN192
- Semiconductor Structural Studies by Raman Spectroscopy AN334
Related Brochures
- EAGLABS Bubble Chart: Analytical Resolution versus Detection Limit BR004
- Materials Characterization Brochure
- PV Materials Characterization for CIGS BR053
- PV Silicon Impurity Analysis BR025
- Materials Characterization for Lithium Ion Battery Technology BR057
- Typical Applications for Techniques / Periodic Table of Elements BR038
- Biomedical Service Brochure BR003
- Amorphous & MicrocrystallineThin Film PV - Application Discussion BR046
- Your Solution for PV Materials Characterization BR032
- Compound Semiconductors for Optoelectronics - SIMS Analytical Services BR010




