Scanning Electron Microscopy, SEM Analysis

Scanning Electron Microscopy (SEM) provides high-resolution and long-depth-of-field images of the sample surface and near-surface. SEM is one of the most widely used analytical tools due to the extremely detailed images it can quickly provide. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector, SEM also offers elemental identification of nearly the entire periodic table.

Evans Analytical Group® (EAG) uses SEM analysis in cases where optical microscopy cannot provide sufficient image resolution or high enough magnification. Applications include failure analysis, dimensional analysis, process characterization, reverse engineering, and particle identification. EAG's expertise and range of experience is invaluable to the industries and customers we serve. Person-to-person service ensures good communication of the results and their implications. Customers are often present during the analysis, enabling an immediate sharing of data, imaging and information.

Please click here to learn about EAG's EMview software for SEM, FIB, TEM, and STEM data processing and display.

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