Who Should Attend?

This course will benefit anyone facing material, surface analysis and characterization problems. The experienced professional will gain breadth of knowledge in techniques complementary to their core skills, and individuals new to the field come away with an excellent overview of the range and application of many techniques.

What You Will Learn:

• The latest techniques and instrumentation for surface and thin film characterization
• The techniques that are best used in different applications
• The basic fundamentals of each technique (how do they work?)*
• How to better interpret data to get the most information from your analysis
• Strengths and limitations of each technique

*Note that the operation of instruments is not discussed.

Why Take This Seminar?

Course Contents:

Section 1.

Section 2.

• Scanning Probe Microscopy
• Scanning Electron Microscopy
• Energy Dispersive Spectroscopy
• Focused Ion Beam
• Transmission Electron Microscopy and Scanning TEM
• Auger Electron Spectroscopy

Section 3.

• X-ray Photoelectron Spectroscopy
• Time-of-Flight Secondary Ion Mass Spectrometry
• Fourier Transform Infrared Spectroscopy
• Raman Spectroscopy
• Gas Chromatography - Mass Spectrometry

Section 4.

• Secondary Ion Mass Spectrometry

Section 5.

• Glow Discharge Mass Spectrometry
• Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry
• Inductively Coupled Plasma-Optical Emission Spectrometry/Mass Spectrometry
• Instrumental Gas Analysis
• X-ray Fluorescence
• X-ray Diffraction

Section 6.