Gary’s background includes over 15 years as a SIMS technical specialist in both magnetic sector and quadrupole instruments.

Gary has published more than 10 papers on SIMS and SIMS related topics, and has delivered well over 30 talks at conferences and technical seminars. His current research interests include the characterization of gate oxides using SIMS and XPS, surface contamination analysis for both metals and particles using SIMS / TXRF / VPD-ICPMS / and Auger, and the characterization of ultra-shallow implants using both SIMS and SRP.

Gary is a graduate of the University of Western Ontario (Canada) where he obtained both an undergraduate and a masters degree in materials engineering. Gary worked at Surface Science Western (Canada) for 10 years performing both SEM and SIMS analysis, before moving to the Evans Analytical group in 1995.

Gary Mount