Dr. Greg Strossman is currently a Specialist in the XPS group and has over 10 years of experience utilizing XPS in the characterization of materials for a broad range of industry sectors.

Greg has published papers and delivered presentations on TOF-SIMS and XPS related topics; and has co-authored a chapter on physical and chemical characterization of semiconductor materials for a recent book published by the CRC Press.

Greg received his Ph.D. in Analytical Chemistry from the University of North Carolina at Chapel Hill. He joined Evans Analytical Group (then Charles Evans & Associates) in 1993 as an Associate Analyst in TOF-SIMS. In his 15 year tenure with the company Greg has gained considerable experience and knowledge on TOF-SIMS, FTIR and ESCA/XPS.

Greg Strossman